发明名称 Apparatus and method for concealing defective pixels in image sensors having test mode
摘要 An apparatus and method for concealing defective pixels in image sensors having a test mode. The image sensing apparatus includes a sensing module for capturing an image from an object, wherein the sensing module includes a plurality of pixels and a light source for detecting a defect of the pixel and wherein the light source is turned on or off for a test mode; a controller for determining whether there are any detective pixels in an image frame received from the sensing module using the light source and for storing a position about defective pixels; and an image concealment unit for comparing a position of the detected defective pixels with a position of the image frame of the object and for concealing the detected defective pixels.
申请公布号 US7286171(B2) 申请公布日期 2007.10.23
申请号 US20010983654 申请日期 2001.10.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM HYUN-EUN
分类号 G06T1/00;H04N9/64;H04N5/225;H04N5/335;H04N5/367;H04N9/07 主分类号 G06T1/00
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