| 摘要 |
PROBLEM TO BE SOLVED: To surely preventing a digital processing device from malfunctioning, even if receiving test-use data at normal mode due to some form of trouble. SOLUTION: A test apparatus 13 is connected to a status signal output terminal that is a normal use output terminal of the digital processing device 11 by using a test jig 14, and the status signal output terminal is forced into its on-state by a test mode switching command generator 13A. A microcomputer 11B from the recognition of the on-state of the status signal output terminal executes a functional test. Test result is transmitted to the test apparatus or a higher-level apparatus 12 through an asynchronous serial data communication. In this transmission, the communication rate in the normal mode is different from that in a test mode, and parity signals in the normal mode and the test mode adopt odd parity in one of the two, and even parity in the other. COPYRIGHT: (C)2008,JPO&INPIT
|
