DYNAMIC METROLOGY SAMPLING FOR A DUAL DAMASCENE PROCESS
摘要
<p>A method of monitoring a dual damascene procedure that includes calculating a pre-processing confidence map for a damascene process, the pre-processing confidence map including confidence data for a first set of dies on the wafer. An expanded pre-processing measurement recipe is established for the damascene process when one or more values in the pre¬ processing confidence map are not within confidence limits established for the damascene process. A reduced pre-processing measurement recipe for the first damascene process is established when one or more values in the pre¬ processing confidence map are within confidence limits established for the damascene process.</p>
申请公布号
WO2007117736(A2)
申请公布日期
2007.10.18
申请号
WO2007US60951
申请日期
2007.01.24
申请人
TOKYO ELECTRON LIMITED;INTERNATIONAL BUSINESS MACHINES CORPORATION;PRAGER, DANIEL;FUNK, MERRITT;NATZLE, WESLEY;SUNDARARAJAN, RADHA