发明名称 ROM INSPECTION SYSTEM AND ROM INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a ROM inspection system or the like, capable of shortening inspection time of image ROM in a mounted stage. SOLUTION: A display device 300 comprises a CPU 301, a CGROM 306, and a VDP 304 which has an accessible area 308 accessible by the CPU 301 and is accessible to the CGROM 306. The CPU 301 is configured to output data read control information for each address corresponding to each address signal line of the CGROM 406 to the VDP 304, and to perform inspection based on data of each address written to the accessible area 308 by the VDP 304. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007264698(A) 申请公布日期 2007.10.11
申请号 JP20060085000 申请日期 2006.03.27
申请人 SEIKO EPSON CORP 发明人 TSUKAGOSHI SHINICHI
分类号 G06F12/16;G01R31/28 主分类号 G06F12/16
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