发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 <p>A positive resist composition capable of forming a high-resolution pattern reduced in LER. The positive resist composition comprises: a resin ingredient (A) which has acid-dissociable dissolution-inhibitive groups and comes to have enhanced alkali solubility by the action of an acid; and an acid generator ingredient (B) which generates an acid upon exposure to light. The positive resist composition is characterized in that the resin ingredient (A) comprises a polymer having a structural unit (a1) derived from hydroxystyrene and a structural unit (a2) derived from an acrylic ester having an acid-dissociable dissolution-inhibitive group and having a fluorine atom or lower fluoroalkyl group bonded to the alpha-position.</p>
申请公布号 KR20070100771(A) 申请公布日期 2007.10.11
申请号 KR20077017340 申请日期 2007.07.27
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 HIROSAKI TAKAKO;ANDO TOMOYUKI;HOJO TAKUMA
分类号 G03F7/039 主分类号 G03F7/039
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