发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN |
摘要 |
<p>A positive resist composition capable of forming a high-resolution pattern reduced in LER. The positive resist composition comprises: a resin ingredient (A) which has acid-dissociable dissolution-inhibitive groups and comes to have enhanced alkali solubility by the action of an acid; and an acid generator ingredient (B) which generates an acid upon exposure to light. The positive resist composition is characterized in that the resin ingredient (A) comprises a polymer having a structural unit (a1) derived from hydroxystyrene and a structural unit (a2) derived from an acrylic ester having an acid-dissociable dissolution-inhibitive group and having a fluorine atom or lower fluoroalkyl group bonded to the alpha-position.</p> |
申请公布号 |
KR20070100771(A) |
申请公布日期 |
2007.10.11 |
申请号 |
KR20077017340 |
申请日期 |
2007.07.27 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
HIROSAKI TAKAKO;ANDO TOMOYUKI;HOJO TAKUMA |
分类号 |
G03F7/039 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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