发明名称 EXTENDED ELECTRON TOMOGRAPHY
摘要 <p>The present invention relates to a method for improving image resolution of a three dimensional structure of at least one molecule conformation comprising the steps of determining a three dimensional structure of at least one conformation of a molecule in a sample from a first data set obtained from a series of 2D measurements of different geometrical projections of the molecule at a low electron beam dose in an electron microscope; producing a second data set comprising calculated two dimensional projections of the determined three dimensional structure of the at least one conformation of the same molecule; correlating data from a third data set obtained from at least one measurement of the same molecule in an electron microscope using a higher electron beam dose with the second data set; and using the correlated data to improve the resolution of the three dimensional structure of the at least one conformation of the molecule by increasing the first data set with the correlated data and re-determining a three dimensional structure.</p>
申请公布号 WO2007114772(A1) 申请公布日期 2007.10.11
申请号 WO2007SE00324 申请日期 2007.04.04
申请人 SIDEC TECHNOLOGIES AB;SKOGLUND, ULF 发明人 SKOGLUND, ULF
分类号 G01N23/04 主分类号 G01N23/04
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