发明名称 |
APPEARANCE INSPECTION OF LCD SURFACE |
摘要 |
A device for inspecting a substrate is provided to use a lamp efficiently and reduce an exchange cost of a lamp efficiently by exactly detecting a lamp exchange time of a lighting unit. A detector of a substrate includes a substrate(S), a substrate frame(130), a lighting unit, and a inspecting unit(138). The substrate frame(130) is adhered to support the substrate(S). The lighting unit has an optical source which illuminates a light on the substrate(S) which is supported by the substrate frame(130). The inspecting unit(138) is fixed on a position of the substrate frame(130) which is opposite to the lighting unit, and predicts an optical source life span of the lighting unit. The inspecting unit(138) is an illuminating sensor which detects an illumination of the optical source. The control unit determines an exchange time of the optical source by receiving an output signal of the inspecting unit(138).
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申请公布号 |
KR20070099745(A) |
申请公布日期 |
2007.10.10 |
申请号 |
KR20060030869 |
申请日期 |
2006.04.05 |
申请人 |
ADP ENGINEERING CO., LTD. |
发明人 |
PARK, JANG WAN;KIM, MIN SUK |
分类号 |
H05K13/08 |
主分类号 |
H05K13/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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