TEST APPARATUS FOR APPLICATION PROCESSOR EMBEDDING ARM CORE

摘要

A device for testing a processor embedded with an ARM code is provided to improve productivity of an ARM core-embedded processor with reduced test time by testing electronic performance of the ARM core-embedded processor at a reference speed in one process. A test board(221) is equipped with a memory device to realize the same configuration as a real use environment of the ARM core-embedded processor(131) and includes an electronic circuit to test a function of the ARM core-embedded processor. An ATE(Automatic Test Equipment)(211) stores a program for testing the ARM core-embedded processor and is electronically connected to the test board when the performance of the ARM core-embedded processor is tested, and generates/provides a control signal for testing the performance of the ARM core-embedded processor to the memory device and the electronic circuit. The memory includes A RAM(223) storing the program needed for testing ARM core-embedded processor and a ROM(224) storing a booting program needed for booting the ARM core-embedded processor.