发明名称 Substrate for the micro-lithography and process of manufacturing thereof
摘要 The invention relates to the manufacture of a substrate which is particularly suitable for EUV micro-lithography and comprises a base layer of low coefficient of thermal expansion (CTE) onto which at least one cover layer made of a semiconductor material is applied. Preferably, the cover layer is a silicon layer, preferably applied by ion beam sputtering. By an additional ion beam figuring treatment substrates of extremely accurate shape and extremely low roughness can be prepared.
申请公布号 US7279252(B2) 申请公布日期 2007.10.09
申请号 US20040753220 申请日期 2004.01.07
申请人 SCHOTT AG 发明人 ASCHKE LUTZ;SCHWEIZER MARKUS;ALKEMPER JOCHEN;SCHINDLER AXEL;FROST FRANK;HAENSEL THOMAS;FECHNER RENATE
分类号 G03F1/00;G21K1/06;B32B9/00;B32B17/06;G02B5/08;G03F1/14;G03F1/16;G03F1/24;G03F9/00;G21K5/00;H01L21/027 主分类号 G03F1/00
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