发明名称 |
Substrate for the micro-lithography and process of manufacturing thereof |
摘要 |
The invention relates to the manufacture of a substrate which is particularly suitable for EUV micro-lithography and comprises a base layer of low coefficient of thermal expansion (CTE) onto which at least one cover layer made of a semiconductor material is applied. Preferably, the cover layer is a silicon layer, preferably applied by ion beam sputtering. By an additional ion beam figuring treatment substrates of extremely accurate shape and extremely low roughness can be prepared.
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申请公布号 |
US7279252(B2) |
申请公布日期 |
2007.10.09 |
申请号 |
US20040753220 |
申请日期 |
2004.01.07 |
申请人 |
SCHOTT AG |
发明人 |
ASCHKE LUTZ;SCHWEIZER MARKUS;ALKEMPER JOCHEN;SCHINDLER AXEL;FROST FRANK;HAENSEL THOMAS;FECHNER RENATE |
分类号 |
G03F1/00;G21K1/06;B32B9/00;B32B17/06;G02B5/08;G03F1/14;G03F1/16;G03F1/24;G03F9/00;G21K5/00;H01L21/027 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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