| 发明名称 |
Stacked tip cantilever electrical connector |
| 摘要 |
A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.
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| 申请公布号 |
US7279917(B2) |
申请公布日期 |
2007.10.09 |
| 申请号 |
US20050211994 |
申请日期 |
2005.08.25 |
| 申请人 |
SV PROBE PTE LTD. |
发明人 |
WILLIAMS SCOTT R.;SHUHART JOHN M.;SLOPEY ALAN;FRICK GUY B. |
| 分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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