发明名称 Germanium on insulator fabrication via epitaxial germanium bonding
摘要 A method of forming a germanium-on-insulator (GOI). An epitaxial germanium layer is formed on top of a first substrate. A first dielectric film is formed on top of the epitaxial germanium layer. A second substrate is provided. The first substrate is bonded to the second substrate by bonding the first dielectric film to the second substrate. The bonding resulted in a bonded wafer pair. The first substrate is removed after the bonding to expose epitaxial germanium layer to form the GOI substrate.
申请公布号 US7279369(B2) 申请公布日期 2007.10.09
申请号 US20030646681 申请日期 2003.08.21
申请人 INTEL CORPORATION 发明人 LEI RYAN;SHAHEEN MOHAMAD A.
分类号 H01L21/00;H01L21/762;H01L29/786 主分类号 H01L21/00
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