发明名称 Method for resolving phase in electronic speckle interferometry
摘要 The invention is a method of determining the phase difference between two interferometric images. The method includes the steps of measuring the intensities of the two beam arms, and measuring the intensities of the interfering beam arms at two different times (two frames). From the recorded data, the phase angle between the arms can be determined for each frame. These frame phase angles subtracted, and the sine of the difference is taken. The resulting data set is examined to determine a multiplicative factor that converts the minimum and maximum to the bounds of the sine function (-1, +1). This multiplicative factor is applied to a bounded trig function of the difference of the frame angles, and the inverse of the bounded trig function is taken, resulting in the phase difference between frames.
申请公布号 US7280187(B1) 申请公布日期 2007.10.09
申请号 US20050248856 申请日期 2005.10.12
申请人 SOUTHEASTERN LOUISIANA UNIVERSITY 发明人 YOSHIDA SANICHIRO
分类号 G01B9/02 主分类号 G01B9/02
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