| 摘要 |
A calibration method for an integrated circuit in various temperature and a calibration apparatus thereof are provided to compensate for the performance changing factor about the temperature after the calibration in a producing process of the integrated circuit. A calibration method for an integrated circuit in various temperature comprises the steps of: determining a performance correction value to be applied to the integrated circuit according to the temperature in order to match a circuit performance value representing performance of the integrated circuit with a predetermined reference performance value(S310); making a correlation table in which the performance correction value is recorded(S320); and extracting the performance correction value corresponding to the ambient temperature from the correlation table, and applying the value to the integrated circuit(S330).
|
