| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device for appropriately determining the inferior place of an inspection target such as the adhesion region of linear foreign matters or the like for inspecting the inspection target, and to provide a PTP-sheet manufacturing apparatus that uses the inspection device. SOLUTION: Respective brightness data of a threshold L1 for relatively specifying a region high in the possibility of foreign matters with high sensitivity and a threshold L2 for relatively specifying a region high in the possibility of the foreign matter with low sensitivity are binarized to form two binarized images (S10). Next, lump processing is performed, to specify (M) connection regions L1(0)-L1(M-1) from one binarized image (L1 image). Furthermore, (N) connection regions L2(0)-L2(N-1) are specified from the other binarized image (L2 image) (S20). Then, a connection region L1(y), containing a connection region L2(x), is extracted, and the foreign matter of a connection region L1(y) is to determine, on the basis of the circumferential length of the connection region L1(y) (S30). COPYRIGHT: (C)2008,JPO&INPIT
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