发明名称 PHASE COMPENSATION SYSTEM, AND LASER SCANNING MICROSCOPE SYSTEM USING SAME
摘要 PROBLEM TO BE SOLVED: To provide a phase compensation system which compensates a phase shift of repetition frequency in the repetition frequency synchronization of two mode-locked pulse laser sources, and to provide a laser scanning microscope system. SOLUTION: The phase compensation system 413 contains two mode-locked pulse laser sources 401 and a laser synchronization device 402 that synchronizes the repetition frequency or cycle of the laser sources. Further, the system is equipped with a detection device 410 which detects the repetition frequency or cycle of the two mode-locked pulse laser sources 401, a phase delaying optical system 411 which varies the phase of the repetition frequency or cycle of laser rays emitted from, at least, one of the two mode-locked pulse laser sources 401, and a drive mechanism 412 which drives the phase delaying optical system 411 to keep the phase of the repetition frequency or cycle of the two mode-locked pulse laser sources 401 constant on the basis of signals obtained through the detection device 410. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007250762(A) 申请公布日期 2007.09.27
申请号 JP20060071118 申请日期 2006.03.15
申请人 OLYMPUS CORP 发明人 TAKIMOTO SHINICHI;HAYASHI SHINICHI;TAIRA KENJI
分类号 H01S3/098;G02B21/00 主分类号 H01S3/098
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