发明名称 Boosting voltage generating circuit for generating a stable boosting voltage under a wider range of supply voltage and semiconductor memory device having the same
摘要 The boosting voltage generating circuit of example embodiments may include a boosting level detection unit, a first boosting pump, and a second boosting pump. The boosting level detection unit may be configured to generate a target level detection signal and a margin level detection signal. The target level detection signal may have a logic state according to a level of a boosting voltage compared with a target voltage level, and the margin level detection signal may have a logic state according to a level of the boosting voltage compared with a margin voltage level, the margin voltage level being higher than the target voltage level. The first boosting pump may be controlled based on a target voltage level. The second boosting pump may be controlled based on a margin voltage level. According to the boosting voltage generating circuit of example embodiments, overshoot of the boosting voltage by the second boosting pump may remarkably decrease. Accordingly, the boosting voltage generating circuit of example embodiments may generate a stable boosting voltage under a wider range of supply voltage.
申请公布号 US2007222500(A1) 申请公布日期 2007.09.27
申请号 US20070707001 申请日期 2007.02.16
申请人 SAMSUNG ELECTRONICS CO. LTD. 发明人 YOUN JAE YOUN;PARK HAN NA
分类号 G05F1/10 主分类号 G05F1/10
代理机构 代理人
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