| 摘要 |
An apparatus for analyzing a product to be analyzed which is located in a receptacle provided with a coupling element, in particular for photometric or spectrophotometric analysis of powder, bulk material, granular material and similar, is provided with a docking element for sealing connection to the coupling element, and with a measuring probe which is arranged in a probe housing and is provided with at least one radiation and light measuring element, at least one measuring window, which is arranged in the beam path and is arranged in a wall of the probe housing, and with at least one detection element for the analysis. The probe housing with the measuring probe is designed and guided displaceably in such a way that at least a part of the probe housing in which the measuring window is located can be inserted into the receptacle for the analysis.
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