发明名称 CONTROL CIRCUIT OF SEMICONDUCTOR DEVICE WITH OVERHEAT PROTECTION FUNCTION
摘要 PROBLEM TO BE SOLVED: To provide a control circuit of a semiconductor device with an overheat protection function having high reliability in simple constitution and to certainly work. SOLUTION: This control circuit of the semiconductor device with the overheat protection function is furnished with a driving circuit 3 to apply driving voltage on the semiconductor device 4 with the overheat protection function in accordance with a PWM signal supplied from outside and an electric current detection circuit 2 to output a detection signal when a driving electric current flowing in the semiconductor device 4 with the overheat protection function exceeds a previously set threshold value electric current. The driving circuit 3 sets off a semiconductor element when a cutoff circuit constituting the semiconductor device 4 with the overheat protection function cuts off input of the semiconductor element, changes the driving voltage to specified voltage so that the driving electric current exceeds the threshold value electric current and holds the driving voltage at the specified voltage while the detection signal is output from the electric current detection circuit 2. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007230278(A) 申请公布日期 2007.09.13
申请号 JP20060051662 申请日期 2006.02.28
申请人 YAZAKI CORP 发明人 YABE HIROO
分类号 B60R16/02;H01L21/822;H01L27/04 主分类号 B60R16/02
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