| 摘要 |
An ion trap mass analyzer 1 is disclosed comprising a segmented rod set. Ions are trapped radially within the mass analyzer by the application of a RF or AC voltage to the electrodes forming the trap in order to create a radial pseudo-potential well. The ions are also confined axially within one of more real, static or DC potential wells, preferably a quadratic axial potential well. A supplemental AC voltage or potential is applied to the electrodes comprising the ion trap mass analyser 1 in order to excite parametrically ions within the ion trap 1. The supplemental AC voltage or potential has a frequency which is substantially different from the fundamental or resonance frequency of the ions to be excited. |
