发明名称 Method for semiconductor gate line dimension reduction
摘要 To reduce the width of a MOSFET gate, the gate is formed with a hardmask formed thereupon. An isotropic etch is then performed to trim the gate in order to reduce the width of the gate. The resulting gate may be formed with a width that is narrower than a minimum width achievable solely through conventional projection lithography techniques.
申请公布号 US7268066(B2) 申请公布日期 2007.09.11
申请号 US20040922093 申请日期 2004.08.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BONSER DOUGLAS J.;PLAT MARINA V.;YANG CHIH YUH;BELL SCOTT A.;DAKSHINA-MURTHY SRIKANTESWARA;FISHER PHILIP A.;LYONS CHRISTOPHER F.
分类号 H01L21/4763;H01L21/28;H01L21/336;H01L29/10 主分类号 H01L21/4763
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