发明名称 |
Method for connecting circuit elements within an integrated circuit for reducing single-event upsets |
摘要 |
A method for connecting circuit elements within an integrated circuit for reducing single-event upsets is disclosed. The integrated circuit includes a first and second circuit elements that are substantially identical to each other. In order to reduce the single-event upsets to the first and second circuit elements, each of the first and second circuit elements is divided into a first sub-element and a second sub-element. The first sub-element of the first circuit element is connected to the second sub-element of the second circuit element. The second sub-element of the first circuit element is connected to the first sub-element of the second circuit element. As a result, the nodal spacings between the sub-elements within the first and second circuit elements are effectively increased without demanding additional real estate.
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申请公布号 |
US7269057(B2) |
申请公布日期 |
2007.09.11 |
申请号 |
US20050116024 |
申请日期 |
2005.04.27 |
申请人 |
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC. |
发明人 |
HADDAD NADIM F.;WOOD NEIL E.;BUMGARNER ADAM;NEIDERER WAYNE;RAMASWAMY SHANKARNARAYANA;DOYLE SCOTT;HOANG TRI-MINH |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
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地址 |
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