发明名称 Method for connecting circuit elements within an integrated circuit for reducing single-event upsets
摘要 A method for connecting circuit elements within an integrated circuit for reducing single-event upsets is disclosed. The integrated circuit includes a first and second circuit elements that are substantially identical to each other. In order to reduce the single-event upsets to the first and second circuit elements, each of the first and second circuit elements is divided into a first sub-element and a second sub-element. The first sub-element of the first circuit element is connected to the second sub-element of the second circuit element. The second sub-element of the first circuit element is connected to the first sub-element of the second circuit element. As a result, the nodal spacings between the sub-elements within the first and second circuit elements are effectively increased without demanding additional real estate.
申请公布号 US7269057(B2) 申请公布日期 2007.09.11
申请号 US20050116024 申请日期 2005.04.27
申请人 BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC. 发明人 HADDAD NADIM F.;WOOD NEIL E.;BUMGARNER ADAM;NEIDERER WAYNE;RAMASWAMY SHANKARNARAYANA;DOYLE SCOTT;HOANG TRI-MINH
分类号 G11C11/00 主分类号 G11C11/00
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