发明名称 Coating and developing system and coating and developing method
摘要 A coating and developing system includes a resist film forming unit block and antireflection film forming unit blocks stacked in layers to form a resist film and an antireflection film underlying the resist film and an antireflection film overlying the resist film in a small space. The coating and developing system can cope with either of a case where antireflection films are formed and where any antireflection film is not formed. Film forming unit blocks: TCT layer B 3 , a COT layer B 4 and a BCT layer B 5 , and developing unit blocks: DEV layers B 1 and B 2 , are stacked up in layers in a processing block S 2 . The TCT layer B 3 , the COT layer B 4 and the BCT layer B 5 are used selectively where antireflection films are formed and any antireflection film is not formed. The coating and developing system is controlled by a carrying program and software.
申请公布号 US7267497(B2) 申请公布日期 2007.09.11
申请号 US20050117552 申请日期 2005.04.29
申请人 TOKYO ELECTRON LIMITED 发明人 AKIMOTO MASAMI;HAYASHI SHINICHI;HAYASHIDA YASUSHI;MATSUOKA NOBUAKI;KIMURA YOSHIO;UEDA ISSEI;ITO HIKARU
分类号 G03D5/00 主分类号 G03D5/00
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