发明名称 Methods of fabricating semiconductor-on-insulator (SOI) substrates and semiconductor devices using sacrificial layers and void spaces
摘要 An SOI substrate is fabricated by providing a substrate having a sacrificial layer thereon, an active semiconductor layer on the sacrificial layer remote from the substrate and a supporting layer that extends along at least two sides of the active semiconductor layer and the sacrificial layer and onto the substrate, and that exposes at least one side of the sacrificial layer. At least some of the sacrificial layer is etched through the at least one side thereof that is exposed by the supporting layer to form a void space between the substrate and the active semiconductor layer, such that the active semiconductor layer is supported in spaced-apart relation from the substrate by the supporting layer. The void space may be at least partially filled with an insulator lining.
申请公布号 US7265031(B2) 申请公布日期 2007.09.04
申请号 US20040972972 申请日期 2004.10.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH CHANG-WOO;PARK DONG-GUN;LEE SUNG-YOUNG;CHOE JEONG-DONG
分类号 H01L21/84;H01L21/336;H01L21/762;H01L27/12;H01L29/786 主分类号 H01L21/84
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