发明名称 FABRICATING METHOD OF GATE HAVING PROTECTING SPACER
摘要 A method for fabricating a gate having a protection spacer is provided to form a protection spacer capable of maintaining a stable gate stack structure by preventing oxidation of a material layer constituting a gate. A gate insulation layer is formed on a semiconductor substrate(100). A gate pattern(125) is formed on the gate insulation layer. A protection spacer is formed on the sidewall of the gate pattern. A thermal oxidation process is performed on the substrate having the protection spacer. A polysilicon pattern(110), a metal silicide pattern(115) and a capping pattern(120) can be sequentially stacked in the gate pattern.
申请公布号 KR20070082778(A) 申请公布日期 2007.08.22
申请号 KR20060015845 申请日期 2006.02.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SE KEUN;BAE, HYUNG BIN
分类号 H01L21/336 主分类号 H01L21/336
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