发明名称 |
FABRICATING METHOD OF GATE HAVING PROTECTING SPACER |
摘要 |
A method for fabricating a gate having a protection spacer is provided to form a protection spacer capable of maintaining a stable gate stack structure by preventing oxidation of a material layer constituting a gate. A gate insulation layer is formed on a semiconductor substrate(100). A gate pattern(125) is formed on the gate insulation layer. A protection spacer is formed on the sidewall of the gate pattern. A thermal oxidation process is performed on the substrate having the protection spacer. A polysilicon pattern(110), a metal silicide pattern(115) and a capping pattern(120) can be sequentially stacked in the gate pattern.
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申请公布号 |
KR20070082778(A) |
申请公布日期 |
2007.08.22 |
申请号 |
KR20060015845 |
申请日期 |
2006.02.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SE KEUN;BAE, HYUNG BIN |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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