发明名称 Process measuring point
摘要 A process for measuring a point comprising at least one spectrometer and a measuring transducer connected thereto for picking up, processing and forwarding measuring signals from the spectrometer, the spectrometer being arranged in an armature for introduction into a process or a process fluid and the data produced by the spectrometer is used to control a process. The armature comprises a housing for receiving the spectrometer and for securing the armature to a process container containing process fluid and a sensor holder with an inbuilt sensor, interacting with the spectrometer and which is guided in an axially displaceable manner in the armature, whereby the sensor holder protrudes into the process fluid in an extended state.
申请公布号 US7259848(B2) 申请公布日期 2007.08.21
申请号 US20040481402 申请日期 2004.09.17
申请人 ENDRESS + HAUSER CONDUCTA GESELLSCHAFT FUR MESS-UND REGELTECHNIK MBH + CO. KG 发明人 WITTMER DETLEV;BABEL WOLFGANG
分类号 G01J3/18;G01J3/42;G01J3/02;G01N21/01;G01N21/27;G01N21/85 主分类号 G01J3/18
代理机构 代理人
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