发明名称 Wafer stage including electrostatic chuck and method for dechucking wafer using the wafer stage
摘要 A wafer stage including an electrostatic chuck and a method for dechucking a wafer using the wafer stage are provided, wherein, the wafer stage includes an electrostatic chuck support, an electrostatic chuck, a lifting means, and a grounding means including a device for connecting the interconnections for grounding the lifting means. According to the method for dechucking a wafer, when a lifting means is in contact with a rear side of the wafer, the lifting means is grounded. Then, an electrostatic chuck is neutralized by supplying power to electrostatic electrodes, and the wafer is neutralized by supplying plasma to the wafer.
申请公布号 US7258811(B2) 申请公布日期 2007.08.21
申请号 US20040864428 申请日期 2004.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHU CHANG-WOONG;CHI KYEONG-KOO;KIM JI-SOO;CHUNG SEUNG-PIL;SEO SANG-HUN
分类号 B44C1/22;H01L21/66;H01L21/683 主分类号 B44C1/22
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