SEMICONDUCTOR TESTING SYSTEM

摘要

The semiconductor testingappts. has a power source allocator for selectively connecting two voltage levels of a powr supply to selectable pins of the device under test to provide a power supply. The allocator has several switches for providing two voltage levels to any selected pins of the device under test. A memory stores control signals for activating a subset of switches to provide one of the two voltage levels to the respective pins. The memory has a shift register storing the control signals, and a control signal source for providing a sequence of control signals to the shift register.