发明名称 PROGRAMMING METHOD FOR THRESHOLD VOLTAGE-CONTROLLED PHASE-CHANGE RANDOM ACCESS MEMORY
摘要 A programming method of a threshold voltage-controlled PRAM(Phase-change Random Access Memory) is provided to improve reliability of data writing by controlling a threshold voltage efficiently. A program region with a threshold voltage corresponding to high data and low data is formed by determining amorphous state of a chalcogen material through programming. During the programming, the quenching speed of the chalcogen material is controlled by control of trailing edges of program pulses so that a threshold voltage of the chalcogen material is controlled. The programming pulse has a melting duration and a quenching duration, and the quenching duration is changed in correspondence to the program information in order to control a quenching period of the chalcogen material melted in the melting duration.
申请公布号 KR20070082473(A) 申请公布日期 2007.08.21
申请号 KR20060045815 申请日期 2006.05.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUH, DONG SEOK;LEE, EUN HONG;NOH, JIN SEO
分类号 G11C13/02 主分类号 G11C13/02
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