发明名称 |
PROGRAMMING METHOD FOR THRESHOLD VOLTAGE-CONTROLLED PHASE-CHANGE RANDOM ACCESS MEMORY |
摘要 |
A programming method of a threshold voltage-controlled PRAM(Phase-change Random Access Memory) is provided to improve reliability of data writing by controlling a threshold voltage efficiently. A program region with a threshold voltage corresponding to high data and low data is formed by determining amorphous state of a chalcogen material through programming. During the programming, the quenching speed of the chalcogen material is controlled by control of trailing edges of program pulses so that a threshold voltage of the chalcogen material is controlled. The programming pulse has a melting duration and a quenching duration, and the quenching duration is changed in correspondence to the program information in order to control a quenching period of the chalcogen material melted in the melting duration.
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申请公布号 |
KR20070082473(A) |
申请公布日期 |
2007.08.21 |
申请号 |
KR20060045815 |
申请日期 |
2006.05.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SUH, DONG SEOK;LEE, EUN HONG;NOH, JIN SEO |
分类号 |
G11C13/02 |
主分类号 |
G11C13/02 |
代理机构 |
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地址 |
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