发明名称 METHOD FOR CLEANING SUBSTRATE PROCESSING CHAMBER, STORAGE MEDIUM AND SUBSTRATE PROCESSING CHAMBER
摘要 A method for cleaning a substrate processing chamber, a storage medium and a substrate processing chamber are provided to prevent formation of an oxide layer on a surface of a component located in the processing chamber. An attached material is removed from a component in a processing chamber using plasma which is produced from oxygen gas introduced into a space(S63). An oxide is removed from the component in the processing chamber by using second plasma which is produced from carbon tetrafluoride gas introduced into the space(S66). The component is an electrode which is disposed facing the substrate transferred into the space, and is connected to a direct current power source.
申请公布号 KR20070081749(A) 申请公布日期 2007.08.17
申请号 KR20070010312 申请日期 2007.01.31
申请人 TOKYO ELECTRON LIMITED 发明人 HONDA MASANOBU;MATSUI YUTAKA
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址