发明名称 METHOD AND DEVICE FOR DETECTING INPUT/OUTPUT CHARACTERISTICS OF SEMICONDUCTOR LASER ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a method of accurately detecting input/output characteristics of a semiconductor laser element in short pulse driving. SOLUTION: Input/output characteristics of a semiconductor laser element 1 are detected in short pulse driving by an input/output characteristic detecting method. At this time, the input/output characteristics and its differential characteristics are measured using both a first light receiving element 60 that receives the total optical flux of a pulse beam radiated from the semiconductor laser element 1, and a second light receiving element 62 which has a light receiving area smaller than that of the first light receiving element 60, and is provided with sufficient response performance for detecting a pulse beam outputted in short pulse driving during the pulse driving with a relatively long pulse width. Based on the coupling efficiency CE of the second light receiving element 62 which is calculated from the measuring result, the input/output characteristics of the semiconductor laser element 1 are calibrated in short pulse driving which is measured by the second light receiving element 62. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007207999(A) 申请公布日期 2007.08.16
申请号 JP20060024953 申请日期 2006.02.01
申请人 DAITRON TECHNOLOGY CO LTD 发明人 IGAWA KATSUHIKO
分类号 H01S5/00 主分类号 H01S5/00
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