| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection apparatus and an inspection method for inspecting whether an Optical Variable Device (OVD) foil has been reliably stamped when the OVD is formed in a substrate. SOLUTION: The OVD foil inspection apparatus is provided with: a light source part for irradiating light to a rewound foil acquired by rewinding a carrier film after the OVD foil is stamped; a trigger part for indicating the timing of capturing optical information acquired on the basis of transmitted light by the irradiation from the light source part; an information collection part for capturing the optical information and transmitting the captured optical information to a post-process; and an information analysis part for comparing a measurement value acquired by analyzing the optical information as an image with a previously stored reference value of an image of a normal rewound foil and determining the quality of an object to be inspected. COPYRIGHT: (C)2007,JPO&INPIT
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