| 摘要 |
PROBLEM TO BE SOLVED: To correctly determine whether stress application or a test is taking place in a device. SOLUTION: A semiconductor device 20 is equipped with a first test circuit 1, a second test circuit 2, a test mode detection circuit 3 and a terminal Pad1. The first test circuit 1 is active, when an input signal IN1 is at "High" level and inactive, when the signal is at "Low" level and changes from "High" level to "Low". The second test circuit 2 is inactive, when an input signal IN2 is at a "Low" level and is active, when the signal is at "High" level and changes from "High" level to "Low". Bias application is continued on a gate of a Pch MOS transistor PT1 provided inside, after the signal changes from "High" level to "Low". COPYRIGHT: (C)2007,JPO&INPIT
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