METHOD FOR ESTIMATING A NOISE GENERATED IN AN ELECTRONIC SYSTEM AND RELATED METHOD FOR TESTING NOISE IMMUNITY

摘要

The invention concerns a method for testing immunity to noise derived from interferences between components in a mixed analogic and digital electronic system. Said method consists in: determining by simulating the highest-level noise observed in the system, or the worst noise generated by interferences. If a test for noise sensitivity is successful with this injected worst noise, then the system is accepted. In the case where the worst noise test fails, the method consists in calculating by simulating the lowest-level noise observed in said system, or the injected best noise. And if a test for noise sensitivity fails with this injected best signal, then the system is rejected. The invention also concerns extraction of macromodel current sources of the cells for injecting said worst and said best noises. Said extraction is performed based on a detailed model of each cell, by comparing the frequency spectra obtained for different switching patterns applied in input of the circuit cells.