TESTING METHOD AND TESTING DEVICE FOR SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To surely detect a memory device in which a malfunction unable to be normally counted up has occurred due to abnormality (failure) in an address counter for a specific address. SOLUTION: The testing method includes: a first step for generating test pattern data from the testing device 1A, which repeat by making the data pattern of odd numbered bit as a unit; a second step for transferring the generated test pattern data to the semiconductor memory device 2 and repeatedly writing them into the semiconductor memory device 2 by making the data pattern of odd numbered bit as a unit; a third step for reading out the data written into the semiconductor memory device 2 and fetching the read out data to the testing device 1A; a fourth step for comparing the data fetched to the testing device 1A with an expected value; and a fifth step for deciding the normal/defective of the semiconductor memory device 2 from the comparison result and displaying data of the decision result. COPYRIGHT: (C)2007,JPO&INPIT