发明名称 METHOD FOR PROCESSING COPPER SURFACE, METHOD FOR FORMING COPPER PATTERN WIRING AND SEMICONDUCTOR DEVICE MANUFACTURED USING SUCH METHOD
摘要 A gas inlet is disposed in a lower portion of a reaction chamber, a copper substrate is disposed in an upper portion thereof, and a tungsten catalytic body heated to 1600° C. is disposed midway between the two. Ammonia gas introduced from the gas inlet is decomposed by the tungsten catalytic body, a chemical species generated by the decomposition reacts with a surface of the copper substrate, and reduces and removes a contaminant on the copper surface, and a Cu<SUB>3</SUB>N thin film is formed on the copper substrate surface. This Cu<SUB>3</SUB>N film has the action of a film which prevents the oxidation of copper. This Cu<SUB>3</SUB>N film is thermally decomposed and removed when heated to temperatures of not less than 300° C., leaving a clean copper surface behind.
申请公布号 US2007187812(A1) 申请公布日期 2007.08.16
申请号 US20050569144 申请日期 2005.06.03
申请人 IZUMI AKIRA 发明人 IZUMI AKIRA
分类号 H01L23/12;B08B7/00;C01B21/06;C23C8/02;C23C8/24;C23C8/80;C23F15/00;C23G5/00;H01L21/00;H01L21/02;H01L21/3205;H01L21/321;H01L21/768 主分类号 H01L23/12
代理机构 代理人
主权项
地址