发明名称 |
LASER REPAIR SYSTEM CAPABLE OF FUSING RESIDUE IN LASER REPAIR PROCESS |
摘要 |
A laser repair system capable of removing residual fuse is provided to control a short-circuit defect of a semiconductor chip by preventing formation of a bridge caused by fusing residue. A focus lens(102) is mounted on laser repair equipment. A focus lens driving motor(104) is positioned on the focus lens. A laser generation source(106) irradiates laser to a wafer(114) through the focus lens. A wafer mounting table(108) is installed under the focus lens, separated from the focus lens. A gas injection kit(110) removes the fusing residue on the wafer having undergone a fusing process by using high pressure gas, installed along the outer part of the focus lens. Non-flammable gas can be used in the gas injection kit, selected from air, nitrogen, argon or carbon dioxide.
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申请公布号 |
KR20070080444(A) |
申请公布日期 |
2007.08.10 |
申请号 |
KR20060011769 |
申请日期 |
2006.02.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, KWANG SOO;KIM, JONG HOAN;YOU, HO JUNG |
分类号 |
H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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