发明名称 LASER REPAIR SYSTEM CAPABLE OF FUSING RESIDUE IN LASER REPAIR PROCESS
摘要 A laser repair system capable of removing residual fuse is provided to control a short-circuit defect of a semiconductor chip by preventing formation of a bridge caused by fusing residue. A focus lens(102) is mounted on laser repair equipment. A focus lens driving motor(104) is positioned on the focus lens. A laser generation source(106) irradiates laser to a wafer(114) through the focus lens. A wafer mounting table(108) is installed under the focus lens, separated from the focus lens. A gas injection kit(110) removes the fusing residue on the wafer having undergone a fusing process by using high pressure gas, installed along the outer part of the focus lens. Non-flammable gas can be used in the gas injection kit, selected from air, nitrogen, argon or carbon dioxide.
申请公布号 KR20070080444(A) 申请公布日期 2007.08.10
申请号 KR20060011769 申请日期 2006.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KWANG SOO;KIM, JONG HOAN;YOU, HO JUNG
分类号 H01L21/82 主分类号 H01L21/82
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