发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a substrate processing apparatus in which malfunction and poor processing due to liquid adhering to a substrate are prevented in an exposure device. <P>SOLUTION: The substrate processing apparatus 500 comprises an indexer block 9, a processing block 10 for antireflection film, a processing block 11 for resist film, a developing block 12, a processing block 13 for resist cover film, a block 14 for removing resist cover film and an interface block 15. An exposure device 16 is disposed contiguously to the interface block 15. The interface block 15 includes a substrate exchange section 150. Three cleaning/drying processing units are stacked in the substrate exchange section 150. In the cleaning/drying processing unit, the cleaning and drying processes are performed to the substrate subjected to exposure. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007201078(A) 申请公布日期 2007.08.09
申请号 JP20060016464 申请日期 2006.01.25
申请人 SOKUDO:KK 发明人 HAMADA TETSUYA
分类号 H01L21/027;B08B3/02;H01L21/304 主分类号 H01L21/027
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