发明名称 Laser atom probe methods
摘要 A laser atom probe ( 100 ) situates a counter electrode between a specimen mount and a detector ( 106 ), and provides a laser ( 116 ) having its beam ( 122 ) aligned to illuminate the specimen ( 104 ) through the aperture ( 110 ) of the counter electrode ( 108 ). The detector, specimen mount ( 102 ), and/or the counter electrode may be charged to some boost voltage and then be pulsed to bring the specimen to ionization. The timing of the laser pulses may be used to determine ion departure and arrival times allowing determination of the mass-to-charge ratios of the ions, thus their identities. Automated alignment methods are described wherein the laser is automatically directed to areas of interest.
申请公布号 US2007181826(A1) 申请公布日期 2007.08.09
申请号 US20040597080 申请日期 2004.08.19
申请人 IMAGO SCIENTIFIC INSTRUMENTS CORPORATION 发明人 BUNTON JOSEPH H.;OLSON JESSE D.
分类号 G01N23/00;H01J37/285;H01J37/304 主分类号 G01N23/00
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