发明名称 TESTER AND TEST METHOD FOR SERIAL PRESENCE DETECT OF MEMORY MODULE
摘要 An SPD(Serial Presence Detect) tester of a memory module and a test method thereof are provided to test the data transmission and receipt and reading/writing characteristic of an SPD element through a computer in connecting a test body with the computer through a parallel port of the computer. An SPD tester(100) of a memory module(90) is composed of a socket(10) connected with a pin of an SPD element(92), wherein the memory module having the SPD element is installed at the socket; a tester body(20) connected with the pin of the SPD element installed at the socket, wherein the socket is installed at the tester body; a cable(21) coupled to the tester body and connected with the pin of the SPD element; plural parallel port pins(40) coupled to one end of the cable and connected with the pin of the SPD element; a parallel port connecting unit(25) covering the parallel port pins at one end of the cable; and a computer(30) provided with a parallel port(41) connected with the parallel port pin, and coupled with the SPD element by the parallel port pin. The computer controls the supply of power to the SPD element, grounding, transmission and receipt of data, and transmission of clocks by selecting the parallel port and tests the reading/writing characteristic of the SPD element.
申请公布号 KR20070079655(A) 申请公布日期 2007.08.08
申请号 KR20060010461 申请日期 2006.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, JUN JUNG;CHO, HYUN JIN;YUN, SANG HAN
分类号 G01R31/26;G06F11/22;H01L21/66 主分类号 G01R31/26
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