TEST HANDLER AND LOADING METHOD OF TEST HANDLER

摘要

A test handler and a loading method of the test handler are provided to effectively divide the controls of longitudinal and horizontal pitches by changing the longitudinal and horizontal pitches of semiconductor devices in order. A test handler(300) is composed of a loader loading semiconductor devices of a client tray(30a) to a test tray(11); a test chamber(330) testing the semiconductor devices completely loaded in the test tray by the loader; and an unloader(350) unloading the semiconductor devices completely tested through the test chamber and contained in the test tray, to the client tray. The loader is composed of at least one movable loading table(311a,311b) reciprocating between first and second regions and having device placing parts aligned with pitches expanded in one direction rather than the pitches among the semiconductor devices loaded in the client tray; a first picking device(313) moving in the first region to transfer and load the semiconductor devices loaded in the client tray, to the device placing parts of the movable loading table disposed in the first region; and a second picking device(314) moving in the second region to transfer and load the semiconductor devices of the movable loading table disposed in the second region, to the test tray.