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发明名称
Probe unit for testing substrate to be mounted semiconductor chip
摘要
申请公布号
KR100743587(B1)
申请公布日期
2007.07.27
申请号
KR20000025746
申请日期
2000.05.15
申请人
发明人
分类号
G01R1/06
主分类号
G01R1/06
代理机构
代理人
主权项
地址
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