METHOD FOR REDUCING OCCURRENCE OF SHORT-CIRCUIT FAILURE IN AN ORGANIC FUNCTIONAL DEVICE

摘要

A method, for reducing occurrence of short-circuit iailure in an organic functional device ( 401) comprising a first transparent electrode layer (104), a second electrode layer (105) and an organic functional layer (103) sandwiched between said first and second electrode layers (104; 105). The method comprises the steps of identifying a portion of said organic functional device ( 401) / said portion containing a defect (102d-e) leading to an increased risk of short-circuit failure, selecting a segment of said second electrode layer (105), said segment corresponding to said portion, and electrically isolating said segment from a remainder of said second electrode layer (105), thereby eliminating short-circuit failure resulting from said defect (102d-e).