<p>A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed.</p>
申请公布号
WO2007083968(A1)
申请公布日期
2007.07.26
申请号
WO2007KR00371
申请日期
2007.01.22
申请人
TECHWING CO., LTD.;KU, TAE HUNG;SHIM, JAE GYUN;NA, YUN SUNG;JEON, IN GU;KIM, DONG HAN
发明人
SHIM, JAE GYUN;NA, YUN SUNG;JEON, IN GU;KU, TAE HUNG;KIM, DONG HAN