发明名称 Internal reset signal generator for use in semiconductor memory
摘要 An internal reset signal generator that generates an internal reset disable signal after an internal high voltage device has been completely reset. This can substantially reduce errors in operation of semiconductor memory devices. A first circuit generates a first control signal until the power source voltage reaches a stabilized state and a second control signal thereafter. A delay circuit responds to the first and second control signals and a reset complete signal from a reset circuit, and generates an internal reset disable signal only when the second control signal and the reset completion signal are inputted simultaneously, and in other cases, generates an internal reset signal. A reset circuit is connected in a feedback circuit with the delay circuit. It resets a high-voltage device in response to the internal reset signal, and generates a reset completion signal when the high voltage device is reset.
申请公布号 US7248085(B2) 申请公布日期 2007.07.24
申请号 US20050131663 申请日期 2005.05.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG WON-CHANG
分类号 G11C7/00;H03L7/00;G11C5/14;H03K17/22 主分类号 G11C7/00
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