发明名称 Method of fabricating a field effect transistor having improved junctions
摘要 A method of forming a field effect transistor is provided which includes forming an amorphized semiconductor region having a first depth from a single-crystal semiconductor region and subsequently forming a first gate conductor above a channel portion of the amorphized semiconductor region. A first dopant including at least one of an n-type dopant and a p-type dopant is then implanted to a second depth into portions of the amorphized semiconductor region not masked by the first gate conductor to form source/drain portions adjacent to the channel portion. The substrate is then heated to recrystallize the channel portion and the source/drain portions of the amorphized semiconductor region. After the heating step, at least a part of the recrystallized semiconductor region is locally heated to activate a dopant in at least one of the channel portion and the source/drain portion.
申请公布号 US7247547(B2) 申请公布日期 2007.07.24
申请号 US20050905454 申请日期 2005.01.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ZHU HUILONG;GLUSCHENKOV OLEG;SUNG CHUN-YUNG
分类号 H01L21/20;H01L21/36 主分类号 H01L21/20
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