发明名称 Method of protecting semiconductor device and protection apparatus for semiconductor device using the same
摘要 A protection apparatus for a semiconductor device includes a DC power source, a load, a semiconductor device arranged between the DC power source and the load and switches the load between a driving state and a stopping state, a comparator comparing a voltage drop across the semiconductor device with a predetermined reference voltage, and a cut off unit cutting a conduction of the semiconductor device between the DC power source and the load when the voltage drop is greater than the predetermined reference voltage. A constant of the circuit element is set so that the reference voltage is not greater than a critical voltage. The critical voltage is a product of the on-resistance of the semiconductor device when its channel temperature is at an upper limit of the permissible temperature, and a minimum current value which causes the channel temperature to reach the upper limit of the permissible temperature by the self-heating due to Joule heat.
申请公布号 US7248452(B2) 申请公布日期 2007.07.24
申请号 US20040519745 申请日期 2004.12.29
申请人 YAZAKI CORPORATION 发明人 OHSHIMA SHUNZOU
分类号 G05F1/10;H02H3/08;H02H3/00;H02H3/20;H02H5/04;H02H9/02;H02H9/04;H03K17/08;H03K17/082;H03K17/14;H03K17/687 主分类号 G05F1/10
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