发明名称 EPITAXIAL GROWTH OF ALIGNED ALGAINN NANOWIRES BY METAL-ORGANIC CHEMICAL VAPOR DEPOSITION
摘要 Highly ordered and aligned epitaxy of III-Nitride nanowires is demonstrated in this work. <1010> M-axis is identified as a preferential nanowire growth direction through a detailed study of GaN/A1N trunk/branch nanostructures by transmission electron microscopy. Crystallographic selectivity can be used to achieve spatial and orientational control of nanowire growth. Vertically aligned (Al)GaN nanowires are prepared on M­plane AIN substrates. Horizontally ordered nanowires, extending from the M-plane sidewalls of GaN hexagonal mesas or islands demonstrate new opportunities for self­ aligned nanowire devices, interconnects, and networks.
申请公布号 WO2006110163(A3) 申请公布日期 2007.07.19
申请号 WO2005US29571 申请日期 2005.08.19
申请人 YALE UNIVERSITY;HAN, JUNG;SU, JIE 发明人 HAN, JUNG;SU, JIE
分类号 H01L21/20;H01L21/205;H01L21/36;H01L21/365 主分类号 H01L21/20
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