DEVICE AND METHOD FOR EVALUATING ELECTROSTATIC DISCHARGE PROTECTION CAPABILITIES

摘要

A device (10) and a method (100) for evaluating ESD protection capabilities of an integrated circuit, the method (100) includes: connecting (110) multiple test probe to multiple integrated circuit testing points. The method (100) is characterized by repeating the stages of : (i) charging (130) a discharge capacitor to an ESD protection circuit triggering voltage level; (ii) connecting (140) the discharge capacitor to the integrated circuit during a testing period such as to cause the discharge capacitor to interact with the integrated circuit; (iii) measuring (150) at least one signal of the integrated circuit, during at least a portion of the testing period; and (iv) determining (160) at least one ESD protection characteristic of the integrated circuit in response to the at least one signal .