发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the temperature dependency of on-state resistance of a vertical MOSFET. SOLUTION: In the super-junction structure wherein an n-type column and a p-type column are repeated, the width of a column where a carrier passes through is 4.5μm or less, and the concentration of impurity of the column where the carrier passes through is adjusted to be lower than a concentration satisfying the reduced surface field. Thus, assuming that on-state resistance at 27°C is R1 and that at 150°C is R2, R2/R1 is less than 1.8 times, and the temperature dependency of resistance can be made low and circuit characteristic be also stabilized. Furthermore, the necessity of keeping the temperature of the semiconductor device constant can be reduced, and a cooling device can be greatly simplified. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007180116(A) 申请公布日期 2007.07.12
申请号 JP20050374170 申请日期 2005.12.27
申请人 TOYOTA CENTRAL RES & DEV LAB INC;DENSO CORP 发明人 HATSUTORI YOSHIKUNI;OKADA KYOKO;YAMAUCHI SHOICHI;YAMAGUCHI HITOSHI
分类号 H01L29/78;H01L29/861 主分类号 H01L29/78
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