发明名称 METHOD FOR STARTING TEST MODE PROVIDED TO OPTICAL DISK DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for starting the test mode provided to an optical disk device simply and at high speed. SOLUTION: When AC power is supplied to a device to start a sub-side microcomputer 22, a voltage from the output terminal T1 of a switch board 1 is converted into a digital value by an A/D conversion means 23. Then, a depressed switch determination means 24 determines a depressed switch by referring to the value of the digital value from the A/D conversion means 23. Subsequently, a test mode starting means 27 reads the test mode corresponding to the determined depressed switch to set it in the optical disk device, and starts the optical disk device in the test mode. A time loss caused by operating a remote controller for starting the test mode is eliminated, and the test mode is started simply and at high speed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007179679(A) 申请公布日期 2007.07.12
申请号 JP20050378155 申请日期 2005.12.28
申请人 FUNAI ELECTRIC CO LTD 发明人 WATANABE TOMOKI
分类号 G11B20/18;G11B7/004 主分类号 G11B20/18
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